It is an “OPTICAL PROBE” that accurately measures the noise electric field and voltage which causes malfunction such as ESD by optical technology without using metal coaxial wire. Since “OPTICAL PROBE” is electrically isolated from the object to be measured, there is no fear that an expensive measuring instrument such as an oscilloscope will be destroyed and safe measurement is possible.
3 types of measurement are possible by connecting E sensor or V sensor to the controller.
① E-field measurement causing malfunction(Frequency, Phase, Strength) : E sensor
② Non-contact measurement of the noise voltage signal of cable/ circuit pattern : E sensor
③ Contact measurement of the noise voltage signal of pin terminal of IC/LSI : V sensor
|Frequency range||100kHz - 10GHz||Cut below 100kHz|
|Guaranteed temp.||0 ～ 40 ℃||―|
|Storage temp.||-10 ～ 50 ℃||No condensation|
|Output connector type||N type||RF output|
|Power supply||AC 100 ～ 265 Ｖ||Single-phase|
|Model number||frequency||E-field strength|
|ES-100||100kHz～10GHz||0.5～25,000V/m||Using spectrum analyzer|
|ES-130||100kHz～10GHz||0.01～500V/m||Using spectrum analyzer|
|Model number||frequency||Measurement voltage range|
E sensor Frequency characteristics
E sensor Directivity
V sensor Input / Output characteristics
① Measure the E-field in the vicinity by performing ESD air discharge to the metal enclosure
② Indirect measurement of ESD voltage on stripline with E sensor.
③ 3) Measure the ESD noise voltage directly to the pin terminal of the control IC with V sensor.
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